A sharper look at the interior of semiconductors
https://www.sciencedaily.com/releases/2021/02/210216133430.htm
Light penetrates the sample and is reflected by internal structures
The imaging procedure is based on optical coherence tomography (OCT), which has been established in ophthalmology for a number of years, explains doctoral candidate Felix Wiesner, the lead author of the study. "These devices have been developed to examine the retina of the eye non-invasively, layer by layer, to create 3-dimensional images." At the ophthalmologist, OCT uses infrared light to illuminate the retina. The radiation is selected in such a way that the tissue to be examined does not absorb it too strongly and it can be reflected by the inner structures. However, the physicists in Jena use extremely short-wave UV light instead of long-wave infrared light for their OCT. "This is due to the size of the structures we want to image," says Felix Wiesner. In order to look into semiconductor materials with structure sizes of only a few nanometres, light with a wavelength of only a few nanometres is needed.