https://www.sciencedaily.com/releases/2020/10/201019133700.htm

In research published today in Patterns, a team of engineers led by Wang demonstrated how a deep learning algorithm can be applied to a conventional computerized tomography (CT) scan in order to produce images that would typically require a higher level of imaging technology known as dual-energy CT.

Wenxiang Cong, a research scientist at Rensselaer, is first author on this paper. Wang and Cong were also joined by coauthors from Shanghai First-Imaging Tech, and researchers from GE Research.